In collaboration with Michalex and DME, we exited to offer you the state of the art SPM technology from DME. Whether you need a stand alone SPM or you want to add imaging capability to your nano indenter, we can provide an easy solution that will enhance you ability to test your materials and generate the data you need.
DME 95-200 in your Nano indenter
The goal of this design is to allow nanoindentation user's to generate a high quality image of an indent just after the test. Minimizing the generation time of the image is critical since the material can present time dependent deformation properties.
Imaging indents with state of the art AFM with the best adapted cantilever avoids compromizing between indentation and imaging and combines two complementary techniques in the same instrument. In other words, we bring the best technologies available in both nano mechanical testing and imaging techniques in the same instrument
The example below shows an image of an indent in a Si sample obtained just after the test with a 95-200 DME model. We can clearly see the sliding stripes corresponding of the crystallographic orientation of the material.The stripes orientation is verified by the modelisation.
Characteristics
Advantages
AFM software in the same PC than the nanoindenter
reduce cost and ease of use
integrated in the main indentation frame
reduce the delay between indentation and image
large image scanning area, 50x50 or 200x200 microns
always find the indent without moving the xy tables
possibility to perform electrical measurement
add new capabilities in the same instrument
same xy tables for the AFM and the nanoindenter
unique positioning references in the instrument
complete automatic test
no need to be an AFM expert to generate high quality images
DME 95-200 in your Nano indenter